Determining physical property of substrate

ABSTRACT

A method of determining a physical property of a substrate includes recording a first spectrum obtained from a substrate, the first spectrum being obtained during a polishing process that alters a physical property of the substrate. The method includes identifying, in a database, at least one of several previously recorded spectra that is similar to the recorded first spectrum. Each of the spectra in the database has a physical property value associated therewith. The method includes generating a signal indicating that a first value of the physical property is associated with the first spectrum, the first value being determined using the physical property value associated with the identified previously recorded spectrum in the database. A system for determining a physical property of a substrate includes a polishing machine, an endpoint determining module, and a database.

TECHNICAL FIELD

This description relates to determining a physical property of asubstrate during a polishing process.

BACKGROUND

There are many situations in which light rays can be used fordetermining a physical characteristic of a material. For example, it issometimes desirable to measure the thickness of a layer that isdeposited on top of a substrate. That is, when a layer on top of asubstrate is being planarized or otherwise partially removed in apolishing process, one may want to determine (directly or indirectly)the remaining thickness so that too much material is not removed. Asanother example, when a layer is being deposited on a substrate, one maywant to determine (directly or indirectly) the deposited thickness sothat too much or too little of the layer material is not deposited. Itcan also be important to determine uniformity of the layer thickness.Thus, the purpose of determining the thickness in some situations may beto determine a desired end point of a manufacturing process or whatpressure profile to use across the wafer, and/or a polish time to usefor the wafer. In other examples, a physical characteristic such asthickness may be determined for quality control, classification,calibration, compatibility testing, or other purposes.

Chemical mechanical polishing (CMP) is one example of a manufacturingprocess in which end point determination or real-time thicknessmonitoring is performed. For example, CMP is sometimes performed on awafer or other substrate that includes integrated circuits. Anintegrated circuit is typically formed on a substrate by the sequentialdeposition of conductive, semiconductive or isolative layers on asilicon wafer. After each layer is deposited, the layer is etched tocreate circuitry features. As a series of layers are sequentiallydeposited and etched, the outer or uppermost surface of the substrate,i.e., the exposed surface of the substrate, becomes increasinglynon-planar. This non-planar surface presents problems in thephotolithographic steps of the integrated circuit fabrication process orthe electrical properties of the contact lines or the devices. Thedeposited layers must be planarized and then polished down to aspecified thickness.

CMP is one accepted method of planarization. This planarization methodtypically requires that the substrate be mounted on a carrier orpolishing head. The exposed surface of the substrate is placed against arotating polishing pad, or a pad that is an axially moving sheet. Thepolishing pad may be either a “standard” pad or a fixed-abrasive pad. Astandard pad has a durable roughened surface, whereas a fixed-abrasivepad has abrasive particles held in a containment media. The carrier headprovides a controllable load profile, i.e., pressure, on the substrateto push it against the polishing pad. A polishing slurry, including atleast one chemically-reactive agent, and abrasive particles if astandard pad is used, is supplied to the surface of the polishing pad.

The effectiveness of a CMP process may be measured by its polishingrate, and by the resulting finish (absence of small-scale roughness) andflatness (absence of large-scale topography) of the substrate surface.The polishing rate, finish and flatness are determined by many factors,including the pad and slurry combination, the carrier headconfiguration, the relative speed between the substrate and pad, and theforce pressing the substrate against the pad.

In order to determine the effectiveness of different polishing tools andprocesses, a so-called “blank” wafer, i.e., a wafer with multiple layersbut no pattern, may be polished in a tool/process qualification step.After polishing, the remaining layer thickness may be measured atseveral points on the substrate surface. The variation in layerthickness provides a measure of the wafer surface uniformity, and ameasure of the relative polishing rates in different regions of thesubstrate. One approach to determining the substrate layer thickness andpolishing uniformity is to remove the substrate from the polishingapparatus and examine it. For example, the substrate may be transferredto a metrology station where the thickness of the substrate layer ismeasured, e.g., with an ellipsometer. This process can be time-consumingand thus costly, and the metrology equipment is costly.

One challenge in CMP is determining whether the polishing process iscomplete or uniform, i.e., whether a substrate layer has been uniformlyplanarized to a desired flatness or thickness. Many different factorscan cause variations in the material removal rate, including variationsin the initial thickness of the substrate layer and its properties, theslurry composition, the polishing pad condition, the relative speedbetween the polishing pad and the substrate, and the load on thesubstrate. These variations in turn cause variations in the time neededto reach the desired thickness and uniformity. Therefore, these andother properties cannot be determined merely as a function of polishingtime.

SUMMARY

The invention relates to determining a physical property of a substrate.For example, it is described that a database can be created from spectrameasured from substrates, the spectra having been associated withcorresponding values for one or more physical properties. By comparing acurrently measured spectrum with the database, a value for the physicalproperty can be determined.

In a first general aspect, a method of determining a physical propertyof a substrate includes recording a first spectrum obtained from asubstrate, the first spectrum being obtained during a polishing processthat alters a physical property of the substrate. The method includesidentifying, in a database, at least one of several previously recordedspectra that is similar to the recorded first spectrum. Each of thespectra in the database has a physical property value associatedtherewith. The method includes generating a signal indicating that afirst value of the physical property is associated with the firstspectrum, the first value being determined using the physical propertyvalue associated with the identified previously recorded spectrum in thedatabase.

Implementations can include any or all of the following features.Multiple spectra can be identified in the database as being similar tothe recorded first spectrum. The method can further include processingthe physical property values associated with the multiple identifiedspectra to determine the first value.

The physical property can be one selected from the group consisting of:a layer thickness on the substrate and a step height on the substrate.The physical property can be one that is determined using a non-opticalmethod. The method can further include establishing the database beforethe steps of recording, identifying and assigning are performed.Establishing the database can include performing a first measurement ofa physical property of the substrate specimen before it is polished, thephysical property being measured in several predefined zones on thesubstrate specimen. Establishing the database can include: polishing thesubstrate specimen after measuring the thickness, the polishing beingdone in several rotations; and collecting spectra from the substratespecimen while it is being polished. Establishing the database caninclude performing a second measurement of the physical property of thesubstrate specimen in the several predefined zones after it is polished.The method can further include assigning, in the database, the firstmeasured physical property to a spectrum that was the first one to becollected during polishing, and assigning the second measured physicalproperty to a spectrum that was the last one collected. The method canfurther include determining interpolation values for the physicalproperty using the first and second measured thicknesses and assigningthe interpolation values to intermediate spectra. The interpolationvalues can be determined by adapting a mathematical curve to correlatedmeasurements of the physical property.

In a second general aspect, a system for determining a physical propertyof a substrate includes a polishing machine for performing a polishingprocess that alters a physical property of the substrate of a substrate.The system further includes a module for recording at least a firstspectrum obtained from the substrate during the polishing process. Thesystem further includes a database having stored therein multiplespectra, each associated with a value of the physical property, whereinat least one spectrum in the database that is similar to the firstspectrum is identified, and the endpoint determining module receives avalue determined using the physical property value associated with theidentified spectrum.

Implementations can include any or all of the following features. Adatabase management module can perform the identification and forwardthe associated value to the endpoint determining-module. The databasemanagement module can further be used in establishing the database bycollecting the spectra and associating them with the respectivephysical-property values. An automated process control module cancontrol the polishing machine using a preselected value obtained fromthe database before the polishing process, the preselected valueobtained through a pre-polish measurement of the substrate. A metrologytool can determine the physical property values before they areassociated with the respective spectra in the database.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a block diagram of an example system for determining aphysical property of a substrate.

FIG. 2 is a schematic diagram of an example system for establishing adatabase of measured spectra associated with physical property values ofa substrate.

FIG. 3 is an example graph of two physical properties versus waferdiameter.

FIG. 4 is a flow chart of an example process for polishing a substrateto a particular thickness.

FIG. 5 is an example graph of thickness versus number of polishingrotations.

FIG. 6 is a block diagram of an example system that measures a physicalcharacteristic of a patterned wafer.

FIG. 7 is a schematic diagram of an example generic computer system.

Like reference symbols in the various drawings indicate like elements.

DETAILED DESCRIPTION

FIG. 1 is a block diagram of an example system for determining aphysical property of a patterned substrate before, during, and/or afterpolishing. For example, the substrate may be a wafer that includesintegrated circuitry. Particularly, the patterned substrate may includeactive regions and trench regions, which are well-known in the area ofsemiconductor manufacturing. As is also well-known, the substrate may becovered by an oxide layer or another dielectric layer that covers boththe active regions and the trench regions. The apparatus can be used fordetermining a thickness of a layer on a substrate, for example an oxidelayer, by recording a spectrum from the substrate being polished andfinding one or more matching spectra in a database of previouslymeasured spectra.

A polishing machine 102 polishes the substrate using conventionalpolishing techniques. An automated process control module 104 controlsthe polishing machine 102 to start the polishing and may defineparameters for the process. Alternatively, a process other thanpolishing may be performed, such as deposition (e.g., chemical vapordeposition), removal processes (e.g., wet and dry etching), orpatterning (e.g., lithography).

The system includes a module using physical property 106 that will use aphysical property determined for the substrate. In one implementation,the module 106 records a spectrum reflected from the substrate andmatches that spectrum with previously recorded spectra in a database.The module using physical property 106 may include, for example, a lightsource and a spectrum recorder. In one implementation, the module usingphysical property 106 can be configured to interrupt or otherwise alterthe polishing process (or other process) when the substrate reaches acertain value of a physical property. In another implementation, thespectrum can be obtained from the substrate in another way, for exampleby being transmitted through the substrate.

A database management module 108 receives a spectrum recorded by themodule using physical property 106. If the spectrum is recorded during asetup process for a database 110, the module 108 can record the spectrumin the database 110, where it can then be used for determining one ormore physical properties for a substrate. In one implementation, andparticularly after receiving a spectrum as part of aproperty-determining operation, the module 108 compares that spectrumwith previously recorded spectra that have physical property valuesassociated with them, selects a matching one of the spectra, andgenerates a signal indicating the identified physical property value.The database management module 108 retrieves the identified physicalproperty value from the database 110.

The database 110 stores previously recorded spectra reflected from oneor more substrates in connection with one or more previous processes. Inaddition, the database 110 stores measured physical property valuesassociated with the recorded spectra. A reference metrology tool 112measures the physical property values to be associated with thepreviously recorded spectra. For example, a spectrum recorded before (orat the beginning of) polishing is associated with a physical propertymeasurement made before polishing and a spectrum recorded after (or atthe end of) polishing is associated with a physical property measurementmade after polishing. Physical property values corresponding to spectrawith characteristics between those of the beginning spectrum and the endspectrum may be extrapolated between the beginning physical propertyvalue and the end physical property value.

The database management module 108 identifies one or more previouslyrecorded spectra that are similar to the spectrum recorded by the moduleusing physical property 106 and generates a signal that indicates thephysical property value associated with the similar spectra.Alternatively, a physical property value may be extrapolated based onthe similar spectrum, the recorded spectra, and the physical propertyvalue associated with the similar spectra. The signal including thephysical property value may be forwarded to the module using physicalproperty 106 or the automated process control module 104 and used tocontrol the polishing machine 102.

In another implementation, the signal is generated by a separate signalgenerating module 114. This module can receive an instruction from thedatabase management module as to what value is to be output. In responseto receiving that communication, the module 114 can generate a signalthat identifies the value and indicates that it is associated with theobtained spectrum. For example, the module 114 can generate such asignal for receipt by the module using physical property 106 or by theautomated process control module 104.

For example, the measured physical property may be a step height ofstructures on the surface of the substrate and may be provided by aprofilometer, such as a high resolution profiler (HRP). In addition, therecorded spectra may indicate by optical interferometry a thickness of aborophosphosilicate glass (BPSG) layer of the substrate. The spectrumreflected by the BPSG during the polishing process is matched with asimilar spectrum previously recorded to determine a previously measuredHRP step height. Reflected spectra may be repeatedly matched to variousones of previously recorded spectra until a desired HRP step height isachieved from the polishing process. After the database 110 of spectraand physical property values is established, profilometer measurementsmay be provided without the presence of a profilometer during thepolishing process. In addition, multiple spectra may be recorded thatcorrespond to multiple zones of the substrate. The recorded spectra maybe used to determine multiple physical property values associated withthe multiple zones. The multiple values may be of a common property orof two or more different properties. For example, any physical propertythat is manifested in a spectrum generated from a substrate can bedetermined.

When multiple spectra are identified in the database as being similar tothe spectrum obtained from the substrate, their correspondingphysical-property values can be processed to generate the-sought value.For example, the system can calculate the average of the valuesassociated with the identified spectra. As another example, the valuescan be statistically processed to determine a representative value, suchas with a least squares method or by eliminating extreme maxima orminima among the values.

FIG. 2 shows a schematic diagram of an example system 200 for generatingthe database by identifying one or more physical property valuesassociated with multiple zones 204 a-d of a substrate 202. A physicalproperty measurement is made for each of the zones 204 a-d, such as stepheights of the zones 204 a-d before a polishing begins. In certainimplementations, another physical property may be measured. Moreover,multiple measurements can be made for a single zones, and thesemeasurements can then be used in determining the property value. Forexample, the value can be determined as an average of all the takenmeasurements for the zone. As another example, this processing can takeinto account a distribution of the values and the average can be skewedaccordingly. In each of the implementations, a large number of valuesmay be taken in an attempt to pick up a variance in the measuredvariable on the wafer.

A polishing apparatus 206 polishes the substrate 202. The apparatus 206includes a light source 208 for producing a light beam to impinge on thesubstrate 202, and a detector 210 for receiving light that is reflectedoff the substrate 202. For example, the light source 208 may be a lightbulb that produces white light, such as light that is essentially withinthe ultraviolet (UV) to infrared (IR) wavelength range. In selectedembodiments, a wavelength range of 2000-15000 Angstrom (A) may be used.In some implementations, the light source 208 is a Tungsten, Xenon, orMercury lamp. Optionally, light source 208 includes fiber optics forguiding the produced light beam onto the substrate 202. The detector 210may be a spectro-photometer that measures reflectance from the patternedsubstrate 202. The detector can have several elements, and each suchelement can be dedicated to a different wavelength range. In someimplementations, the detector 210 includes an array of silicon diodes asis well-known. The detector 210 is capable of measuring reflectance overa range of wavelengths.

A reflected light beam emerges from the substrate 202 as a result of theincident light beam. The reflected light is preferably detectedseparately for the various zones 204 a-d. The reflected light beam, asis well-known, consists of light that is reflected from severaldifferent layers in the substrate 202. That is, when the substrate 202consists of several layers with different refractions indices, eachboundary between layers may give rise to a light reflection thatcontributes to the overall reflected light beam.

The detector 210 detects the reflected light beam and transmits thedetected spectrum to a computer that may also control the light source208. The detector 210 may detect reflectances from the substrate 202over a wavelength interval, for example, 2500-8000 A. For example, thedetector 210 transmits information to the computer that can begraphically displayed as a reflectance spectrum over the registeredwavelength range.

The reflected light beam for each of the regions 204 a-d is detected bydetector 210 and corresponding spectra are transmitted to the computer.These measured reflectances can be used to build a database of measured-spectra and associated physical characteristics for the patternedsubstrate 202.

The substrate 202 is measured again after the polishing process toobtain new step heights (or another physical property) of the zones 204a-d. These pre-polishing and post-polishing measurements will be used ingenerating the database. Spectra 214 taken during a first rotation ofthe polishing apparatus 206 and spectra 216 taken during a last rotationof the polishing apparatus 206 are associated with physical propertyvalues 218 measured before and after the polishing, respectively. Incertain implementations, this establishes a database of spectra andassociated physical property values that may be used to identifyphysical property values of subsequent similar substrates duringpolishing processes.

FIG. 3 shows an example graph 300 of step height and thickness versuswafer diameter. Here, wafer diameter, shown on the horizontal axis, ismeasured in millimeters from the center of the substrate in a positiveand a negative direction. The step height physical property is measuredin Angstroms and is shown on the left vertical axis. The thickness ismeasured in nanometers and is shown on the right vertical axis. Line 302in the graph represents a height physical property of a substrate asmeasured by an HRP metrology tool. For example, this tool can beincluded in the reference metrology tool 112 (FIG. 1). Particularly,each of the discrete data points shown in the line 302 here correspondsto a measurement done with the tool, and the remainder of the linerepresents an interpolation between these points. Line 304, in turn, isa height as determined by matching spectra recorded from the substratewith previously recorded spectra having associated height measurements.These previously recorded spectra and their associated physicalcharacteristic values (here, thicknesses) can be stored in the database110 (FIG. 1). The matching of spectra from the current substrate withpreviously recorded spectra allow height measurements to be determinedfor the recorded spectra as shown by the line 304.

More than one physical property of the substrate can be determined usingthe spectra recorded from the substrate. For example, a layer thicknesscan be determined in addition to, or in lieu of, the step height as willnow be described. Line 306 is a thickness physical property asdetermined by an optical thickness metrology tool. Similarly to theabove description, the data points can be determined by the opticalthickness metrology tool and this tool can be included in the metrologytool 112 (FIG. 1). Line 308 is a thickness as determined by matchingspectra recorded from the substrate with previously recorded spectrahaving associated thickness measurements. The matching of spectra fromthe current substrate with previously recorded spectra allow thicknessvalues to be determined for the recorded spectra as shown by the line308. Particularly, the spectra used in determining the line 304 can beused for determining the line 308. Also, each of the previously recordedspectra can have property values for multiple types of propertiesassociated therewith. For example, assume that each of the individualstep height values that makes up the line 304 is identified by a matchwith a separate spectrum in the database 110 (FIG. 1). Each of theseseparate spectra in the database can also have thickness valuesassociated with it, and these thickness values are in this example usedto obtain the respective thickness values that make up the line 308. Forexample, when a match is found in the database, one or more of thecorresponding property values associated therewith can be retrieved.

FIG. 4 shows an example process 400 for polishing a substrate using adatabase of spectra and physical property values. Process 400 measures(402) a wafer during polishing. In addition, process 400 extracts preand post polish thickness profiles. For example, the thickness profilesmay be derived from spectra recorded at the beginning and end of thepolishing. A process control engine presets (404) polish parameters fora next wafer based on the pre and post polish profiles of the firstwafer. The process control engine may preset (404) the polish parametersagain for one or more wafers based on the pre and post thicknessprofiles of the first wafer. Thus, polishing parameters for a next waferto be polished can be set using profiles for a previously polishedwafer.

FIG. 5 shows an example graph 500 of thickness versus polishingrotations. The horizontal axis ranges from 0 to 60 rotations of apolishing machine that is operating on a substrate. Alternatively, thehorizontal axis could be measured in units of time for the polishingprocess. The vertical axis represents the thickness of the substrate inAngstroms. Data points 502 represent measurements of the thickness takenat each rotation of the polishing machine for a particular location onthe substrate, a middle-center zone. Particularly, there are severalmeasurements in this zone for each rotation. An equation of a line 504is determined based on the data points 502, such as a line determined bylinear regression. In addition, a correlation factor or goodness of fitcalculation is made to determine how well the determined line 504represents the data points 502. The line 504 may be used, for example,to calculate thickness values for rotation values where spectra were notrecorded.

The line 504 is of the form:

y=kx+c,

where y is the thickness, x is the number if rotations, k is a removalrate per rotation, and c is the initial thickness of the substrate.Thicknesses in the regions outside of the measured thicknesses may beinterpolated using the equation above. For example, a thickness lessthan the smallest measured thickness, such as 2500, may be achieved witha number of polishing rotations greater than the largest measuredrotation, such as 60.25. The number of rotations (i.e., 60.25) needed toreach a thickness of 2500 is determined using the equation of the line504.

Each data point 502 corresponds to a measured spectrum. Thus data points502 near the left side of the graph 500 correspond to a spectrummeasured at the beginning of the polishing process, such as the spectrum214, and data points 502 near the right side of the graph 500 correspondto a spectrum measured at the end of the polishing process, such as thespectrum 216. Thicknesses associated with previously recorded spectrastored in a database are retrieved. The thicknesses and their associatednumber of polishing rotations are shown here in the graph 500.

The equation above may also be used to determine the amount of wear on apolishing device (e.g., a polishing pad). As the polishing device beginsto wear, the thickness determined begins to stray from the line 504determined by the equation. Less material is removed as the polishingdevice wears down and the thickness determined by, for example, opticalthickness metrology is greater than the thickness as calculated by theequation. This causes the slope of the line 504 (i.e., the polishingrate) to be reduced and the line 504 flattens out. Accordingly,monitoring this property during the process can give an indication ofwhether the process is progressing normally.

Implementations described herein can be used with any type of procedurewhere one or more physical properties of a substrate are determined, andnot only in connection with a polishing process, which has beenmentioned above as an example. Nevertheless, as an illustration of apolishing process there will now be described how a polishing system canbe configured and operated. FIG. 6 shows a chemical mechanical polishing(CMP) apparatus 20 in which one or more substrates 10 can be polished.For example, a Shallow Trench Isolation (STI) process could produce thesubstrate 10. The CMP apparatus includes a rotatable platen 24 on whichis placed a polishing pad 30. This may be a two-layer polishing pad witha hard durable outer surface or a relatively soft pad. If substrate 10is an “eight-inch” (200 millimeter) or “twelve-inch” (300 millimeter)diameter disk, then the platen and polishing pads will be about twentyinches or thirty inches in diameter, respectively. The platen 24 may beconnected to a platen drive motor (not shown). For most polishingprocesses, the platen drive motor rotates platen 24 at thirty to twohundred revolutions per minute, although lower or higher rotationalspeeds may be used.

Polishing pad 30 typically has a backing layer 32 which abuts thesurface of platen 24 and a covering layer 34 which is used to polishsubstrate 10. Covering layer 34 is typically harder than backing layer32. However, some pads have only a covering layer and no backing layer.Covering layer 34 may be composed of an open cell foamed polyurethane ora sheet of polyurethane with a grooved surface. Backing layer 32 may becomposed of compressed felt fibers leached with urethane. A two-layerpolishing pad, with the covering layer composed of IC-1000 and thebacking layer composed of SUBA-4, is available from Rodel, Inc., ofNewark, Del. (IC-1000 and SUBA-4 are product names of Rodel, Inc.).

The CMP apparatus 20 may include one or more carrier head systems 70,optionally mounted on a rotatable multi-head carousel (not shown). Thecarrier head system is supported by a support plate 66. The carrier headsystem includes a carrier or carrier head 80. A carrier drive shaft 74connects a carrier head rotation motor 76 to each carrier head 80 sothat each carrier head can independently rotate about it own axis. Inaddition, each carrier head 80 independently laterally oscillates. Forexample, a slider (not shown) may support each drive shaft in itsassociated radial slot, and a radial drive motor (not shown) may movethe slider to laterally oscillate the carrier head.

The carrier head 80 performs several mechanical functions. Generally,the carrier head holds the substrate against the polishing pad, evenlydistributes a downward pressure across the back surface of thesubstrate, transfers torque from the drive shaft to the substrate, andensures that the substrate does not slip out from beneath the carrierhead during polishing operations.

Carrier head 80 may include a flexible membrane 82 that provides amounting surface for substrate 10, and a retaining ring 84 to retain thesubstrate beneath the mounting surface. Pressurization of a chamber 86defined by flexible membrane 82 forces the substrate against thepolishing pad. Retaining ring 84 has a lower surface 88 which mayreflect light.

A slurry 38 containing a reactive agent and a chemically- reactivecatalyzer (e.g., potassium hydroxide for oxide polishing) may besupplied to the surface of polishing pad 30 by a slurry supply port orcombined slurry/rinse arm 39. If polishing pad 30 is a standard pad,slurry 38 may also include abrasive particles (e.g., silicon dioxide foroxide polishing).

In operation, the platen is rotated about its central axis 25, and thecarrier head is rotated about its central axis 81 and translatedlaterally across the surface of the polishing pad. A hole 26 is formedin platen 24 and a transparent window 36 is formed in a portion ofpolishing pad 30 overlying the hole. Hole 26 and transparent window 36are positioned such that they have a view of substrate 10 during aportion of the platen's rotation, regardless of the translationalposition of the carrier head.

An optical system 40 is secured to platen 24 generally beneath hole 26and rotates with the platen. The system includes the light source 44 andthe detector 46. The light source generates a light beam 42 whichpropagates through transparent window 36 and slurry 38 to impinge uponthe exposed surface of substrate 10. The light beam 42 is projected fromlight source 44 at an angle É from an axis normal to the surface ofsubstrate 10, i.e., at an angle Éfrom axes 25 and 81. In addition, ifthe hole 26 and window 36 are elongated, a beam expander (notillustrated) may be positioned in the path of the light beam to expandthe light beam along the elongated axis of the window.

Light source 44 may operate continuously. Alternately, it may beactivated to generate light beam 42 during a time when hole 26 isgenerally adjacent substrate 10. CMP apparatus 20 may include a positionsensor 160, such as an optical interrupter, to sense when window 36 isnear the substrate. For example, the optical interrupter could bemounted at a fixed point opposite carrier head 80. A flag 162 isattached to the periphery of the platen. The point of attachment andlength of flag 162 is selected so that it interrupts the optical signalof sensor 160 from a time shortly before window 36 sweeps beneathcarrier head 80 to a time shortly thereafter. The output signal fromdetector 46 may be measured and stored while the optical signal ofsensor 160 is interrupted.

In operation, light source 44 may generate the light beam 42 to impingeon the substrate 10. The detector 46, in turn, receives a light beam 56that is reflected off the substrate 10. The detector 46 may transmitcorresponding information about the reflected light beam 56 to thecomputer 48. Information received or processed by the computer 48 may beoutput on the display device 49. For example, the computer determines anendpoint as described above. When the computer 48 determines that theendpoint of the CMP process has been reached, it can terminate the CMPby deactivating the CMP apparatus 20.

FIG. 7 is a schematic diagram of an example of a generic computer system700. The system 700 can be used for the operations described inassociation with the methods described herein. For example, the system700 may be included in either or all of the system 100 and the apparatus200.

The system 700 includes a processor 710, a memory 720, a storage device730, and an input/output device 740. Each of the components 710, 720,730, and 740 are interconnected using a system bus 750. The processor710 is capable of processing instructions for execution within thesystem 700. In one implementation, the processor 710 is asingle-threaded processor. In another implementation, the processor 710is a multi-threaded processor. The processor 710 is capable ofprocessing instructions stored in the memory 720 or on the storagedevice 730 to display graphical information for a user interface on theinput/output device 740.

The memory 720 stores information within the system 700. In oneimplementation, the memory 720 is a computer-readable medium. In oneimplementation, the memory 720 is a volatile memory unit. In anotherimplementation, the memory 720 is a non-volatile memory unit.

The storage device 730 is capable of providing mass storage for thesystem 700. In one implementation, the storage device 730 is acomputer-readable medium. In various different implementations, thestorage device 730 may be a floppy disk device, a hard disk device, anoptical disk device, or a tape device.

The input/output device 740 provides input/output operations for thesystem 700. In one implementation, the input/output device 740 includesa keyboard and/or pointing device. In another implementation, theinput/output device 740 includes a display unit for displaying graphicaluser interfaces.

The features described can be implemented in digital electroniccircuitry, or in computer hardware, firmware, software, or incombinations of them. The apparatus can be implemented in a computerprogram product tangibly embodied in an information carrier, e.g., in amachine-readable storage device or in a propagated signal, for executionby a programmable processor; and method steps can be performed by aprogrammable processor executing a program of instructions to performfunctions of the described implementations by operating on input dataand generating output. The described features can be implementedadvantageously in one or more computer programs that are executable on aprogrammable system including at least one programmable processorcoupled to receive data and instructions from, and to transmit data andinstructions to, a data storage system, at least one input device, andat least one output device. A computer program is a set of instructionsthat can be used, directly or indirectly, in a computer to perform acertain activity or bring about a certain result. A computer program canbe written in any form of programming language, including compiled orinterpreted languages, and it can be deployed in any form, including asa stand-alone program or as a module, component, subroutine, or otherunit suitable for use in a computing environment.

Suitable processors for the execution of a program of instructionsinclude, by way of example, both general and special purposemicroprocessors, and the sole processor or one of multiple processors ofany kind of computer. Generally, a processor will receive instructionsand data from a read-only memory or a random access memory or both. Theessential elements of a computer arc a processor for executinginstructions and one or more memories for storing instructions and data.Generally, a computer will also include, or be operatively coupled tocommunicate with, one or more mass storage devices for storing datafiles; such devices include magnetic disks, such as internal hard disksand removable disks; magneto-optical disks; and optical disks. Storagedevices suitable for tangibly embodying computer program instructionsand data include all forms of non-volatile memory, including by way ofexample semiconductor memory devices, such as EPROM, EEPROM, and flashmemory devices; magnetic disks such as internal hard disks and removabledisks; magneto-optical disks; and CD-ROM and DVD-ROM disks. Theprocessor and the memory can be supplemented by, or incorporated in,ASICs (application-specific integrated circuits).

To provide for interaction with a user, the features can be implementedon a computer having a display device such as a CRT (cathode ray tube)or LCD (liquid crystal display) monitor for displaying information tothe user and a keyboard and a pointing device such as a mouse or atrackball by which the user can provide input to the computer.

The features can be implemented in a computer system that includes aback-end component, such as a data server, or that includes a middlewarecomponent, such as an application server or an Internet server, or thatincludes a front-end component, such as a client computer having agraphical user interface or an Internet browser, or any combination ofthem. The components of the system can be connected by any form ormedium of digital data communication such as a communication network.Examples of communication networks include, e.g., a LAN, a WAN, and thecomputers and networks forming the Internet.

The computer system can include clients and servers. A client and serverare generally remote from each other and typically interact through anetwork, such as the described one. The relationship of client andserver arises by virtue of computer programs running on the respectivecomputers and having a client-server relationship to each other.

Although a few implementations have been described in detail above,other modifications are possible. In addition, the logic flows depictedin the figures do not require the particular order shown, or sequentialorder, to achieve desirable results. In addition, other steps may beprovided, or steps may be eliminated, from the described flows, andother components may be added to, or removed from, the describedsystems. Accordingly, other implementations are within the scope of thefollowing claims.

A number of embodiments of the invention have been described.Nevertheless, it will be understood that various modifications may bemade without departing from the spirit and scope of the invention.Accordingly, other embodiments are within the scope of the followingclaims.

1. A method of determining a physical property of a substrate, themethod comprising: recording a first spectrum obtained from a substrate,the first spectrum being obtained during a polishing process that altersa physical property of the substrate; identifying, in a database, atleast one of several previously recorded spectra that is similar to therecorded first spectrum, each of the spectra in the database having aphysical property value associated therewith; and generating a signalindicating that a first value of the physical property is associatedwith the first spectrum, the first value being determined using thephysical property value associated with the identified previouslyrecorded spectrum in the database.
 2. The method of claim 1, whereinmultiple spectra are identified in the database as being similar-to therecorded first spectrum.
 3. The method of claim 2, further comprisingprocessing the physical property values associated with the multipleidentified spectra to determine the first value.
 4. The method of claim1, wherein the physical property is one selected from the groupconsisting of: a layer thickness on the substrate and a step height onthe substrate.
 5. The method of claim 1, wherein the physical propertyis one that is determined using a non-optical method.
 6. The method ofclaim 1, further comprising establishing the database before the stepsof recording, identifying and assigning are performed.
 7. The method ofclaim 6, wherein establishing the database comprises performing a firstmeasurement of a physical property of the substrate specimen before itis polished, the physical property being measured in several predefinedzones on the substrate specimen.
 8. The method of claim 7, whereinestablishing the database further comprises: polishing the substratespecimen after measuring the thickness, the polishing being done inseveral rotations; and collecting spectra from the substrate specimenwhile it is being polished.
 9. The method of claim 8, whereinestablishing the database further comprises performing a secondmeasurement of the physical property of the substrate specimen in theseveral predefined zones after it is polished.
 10. The method of claim9, further comprising assigning, in the database, the first measuredphysical property to a spectrum that was the first one to be collectedduring polishing, and assigning the second measured physical property toa spectrum that was the last one collected.
 11. The method of claim 10,further comprising determining interpolation values for the physicalproperty using the first and second measured thicknesses and assigningthe interpolation values to intermediate spectra.
 12. The method ofclaim 11, wherein the interpolation values are determined by adapting amathematical curve to correlated measurements of the physical property.13. A computer program product tangibly embodied in a computer-readablestorage device, the computer program product including instructionsthat, when executed, cause a processor to perform operations comprising:recording a first spectrum obtained from a substrate, the first spectrumbeing obtained during a polishing process that alters a physicalproperty of the substrate; identifying, in a database, at least one ofseveral previously recorded spectra that is similar to the recordedfirst spectrum, each of the spectra in the database having a physicalproperty value associated therewith; and generating a signal indicatingthat a first value of the physical property is associated with the firstspectrum, the first value being determined using the physical propertyvalue associated with the identified previously recorded spectrum in thedatabase.
 14. A system for determining a physical property of asubstrate, the system including: a polishing machine for performing apolishing process that alters a physical property of a substrate; amodule for recording at least a first spectrum obtained from thesubstrate during the polishing process; and a database having storedtherein multiple spectra, each associated with a value of the physicalproperty, wherein at least one spectrum in the database that is similarto the first spectrum is identified, and the module receives a valuedetermined using the physical property value associated with theidentified spectrum.
 15. The system of claim 14, wherein a databasemanagement module performs the identification and forward the associatedvalue to the endpoint determining module.
 16. The system of claim 15,wherein the database management module further is used in establishingthe database by collecting the spectra and associating them with therespective physical-property values.
 17. The system of claim 14, furthercomprising an automated process control module that controls thepolishing machine using a preselected value obtained from the databasebefore the polishing process, the preselected value obtained through apre-polish measurement of the substrate.
 18. The system of claim 14,further comprising a metrology tool that determines the physicalproperty values before they are associated with the respective spectrain the database.